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Using Tolerance Bands on Test-Related Metrics to Plan and Manage the "Crunch"

This paper examines the successful application of tolerances on process metrics used in management activities of an ongoing test project. The result was a more stable system during the "crunch" at the end of the test cycle.

Jon Hagar's picture Jon Hagar
IEEE/EIA 12207 as the Foundation for Enterprise Software Processes

Quote from the abstract: "It is widely believed that the adoption of predefined processes aids the productivity and quality of software development. Furthermore, it is widely believed that the adoption of these processes at the enterprise level provides advantages of repeatability and organizational maturity that amplify the benefits. Unfortunately, the existing corpus of software engineering practice standards has been targeted for adoption at the project level rather than the enterprise level. A new standard, IEEE/EIA 12207, Software Life Cycle Processes, addresses this problem--it is intended as an integrating, organizing, strategic standard specifically directed to enterprise adoptio

TechWell Contributor's picture TechWell Contributor
Getting Started with Software Risk Management

This article is a basic introduction to the concepts of Software Risk Management. It includes discussions of: Identifying the Risks, Analyzing the Risks, Building the Risk Management Plan, Tracking and Controlling to the Plan and Learning from Experiences.

TechWell Contributor's picture TechWell Contributor
TOM - Test Organisation Maturity Questionnaire

Systeme Evolutif have developed a Test Organisation Model, TOM™ to address the primary concern that the outcome of the assessment should address the problems being experienced. The assessment process is based on a relatively simple questionnaire that can be completed and a TOM™ score derived without the assistance of a consultant. Completed questionnaires can be returned by mail or on-line and a prioritised list of test improvement suggestions obtained free from Evolutif.

Paul Gerrard's picture Paul Gerrard
Test Strategies and Plans

This paper discusses the fundamental approaches to establishing a test strategy and the varying levels of the test plan.

Rick Craig's picture Rick Craig
Inspection Generic Ruleset Simplified Version (template)

This document is a contains a simplified ruleset for inspections.

Steve Allott's picture Steve Allott
Inspection Entry & Exit Criteria from Gilb/Graham

These are generic entry and exit criteria used on Inspections at ISS based on the work done by Gilb & Graham. Some of them were waived initially in order to get the process accepted, although we accept that this is far from ideal.

Steve Allott's picture Steve Allott
The Seven Habits of Highly Effective Inspection Teams

My personal experience of trying to introduce an Inspection programme at a UK software house.

Steve Allott's picture Steve Allott
Transferring Software Development Best Known Methods between Generational Product Lines

Launching a new product line is a difficult and time-consuming task under the best circumstances. While working on a new project can be refreshing, difficulties arise in allocating sufficient resources to create and tune the new product development processes. Modifying the processes or Best-Known Methods (BKMs) of the past is one technique employed to allocate time and resources more effectively. Transferring BKMs from an earlier product line into the current one can bring about its own set of challenges which include: defining the BKMs, producing repeatable BKMs to be deployed in varied environments, implementing techniques to log the BKMs, and placing the BKMs in a central location. This paper discusses one approach to transfer software BKMs between generational product lines. The topics addressed include: defining the project's mission and goals; creating definitions and processes to support the BKM transference; encountering and solving issues while implementing the processes.

Definition of Defect Density

This brief article by Linda Westfall defines the defect metric of Defect Density and gives two examples of how it could be reported and utilized.

Linda Westfall's picture Linda Westfall

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