A Comparison of IBM's Orthogonal Defect Classification to Hewlett Packard's Defect Origins, Types, and Modes

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September 28, 2001

Summary

In the last three years, the author has worked with seven Software Development teams to help them categorize defects using Hewlett Packard's Defect Origins, Types, and Modes. More recently, the author has assisted a software testing and development organization analyze the results of defects categorized using IBM's Orthogonal Defect Classification (ODC).

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Topics:

architecture function points estimating high reliability development lifecycles software engineering test methodologies testability tqm usability

About The Author

John Huber

Jon Huber has worked in the software industry for over a decade. After graduating from The University of Arizona, he went to work as a software engineer for IBM in Austin, Texas. After a few years, Jon took a software engineering job with Micron Semiconductor, Inc., in Boise, Idaho to move closer to family. At IBM and Micron, he worked primarily with object-oriented software systems. Jon now works for Hewlett-Packard in the LaserJet Business Products division in Boise, Idaho. For more than three years at HP, he led the LaserJet Common Software Metrics Initiative which provides measurement consulting and a metrics tool for over 34 past and current LaserJet products. Jon also champions defect and root cause analysis and has facilitated eight defect analysis projects for HP. While working at Hewlett-Packard, he has authored several papers for Quality Week, Quality Week Europe, and Applications of Software Measurement/Management Conferences. Jon recently has been asked to help lead a task force to implement customer solution testing in the Hewlett-Packard LaserJet Test Lab. Outside of work, Jon enjoys family activities with his wife and four children, community service in a local youth organization, writing, jogging, and lifting weights.