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Sridhar Kasibhatla

Sridhar Kasibhatla

Member for

18 years 10 months

Sridhar Kasibhatla was born in India and trained in electrical engineering. Since 2003, he has been working as a test analyst with Tait Electronics Ltd. in Christchurch, New Zealand. He is involved in various test plans and test designs, mainly using a Rapid Testing approach.

Sridhar Kasibhatla

Sridhar Kasibhatla was born in India and trained in electrical engineering. Since 2003, he has been working as a test analyst with Tait Electronics Ltd. in Christchurch, New Zealand. He is involved in various test plans and test designs, mainly using a Rapid Testing approach.

All Articles by Sridhar Kasibhatla

All Stories by Sridhar Kasibhatla

a fairly typical example of a set of test notes for a relatively tightly constrained piece of testing Test Notes and Coverage Maps--Aids for Rapid Testing

As delivery cycles get shorter, rapid test techniques are gaining in popularity. In this article, Sridhar Kasibhatla and Andrew Robins explore the concept of using coverage maps and test notes to support exploratory testing and concurrent test design. These maps and test notes also are used to review and track test coverage and can help document dynamically generated test cases for future re-use.