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Mahesh Pande

Member for

17 years

Mahesh Pande is a senior software specialist at Patni and has over eleven years of software experience. This experience spreads across design, development, and the testing domains of the software development life cycle. In testing and test automation of software applications, Mahesh has over seven years of experience. His expertise lies in presentation layer testing and API level testing. He was also involved in testing swing applications at Sun Microsystems Inc. for two years.

Company
Patni Computer Syste
Industry
Business Services - Consulting - Non-profit
Interests
Configuration Management
Defect or Incident Management
Design and Architecture
Development
Process Improvement
Software Testing
Country
India

Mahesh Pande is a senior software specialist at Patni and has over eleven years of software experience. This experience spreads across design, development, and the testing domains of the software development life cycle. In testing and test automation of software applications, Mahesh has over seven years of experience. His expertise lies in presentation layer testing and API level testing. He was also involved in testing swing applications at Sun Microsystems Inc. for two years.

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White Paper: Software Component Testing and Test Automation in Embedded Systems

This paper addresses the need for software component testing in embedded systems because software now makes up 90 percent of the value of the embedded system devices. More so, the software architecture of embedded system devices, in most cases, is componentized in nature. Further to add, at the system level, embedded system devices are extremely hard to test and the defects detected are further more complicated to debug and fix at the system level. Hence, if the software part is tested first by implementing component testing, then, the software components are ensured to be with minimal defects or with no critical defects when the system testing phase begins.