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Home > Detail: A Comparison of IBM’s Orthogonal Defect Classification to Hewlett Packard’s Defect Origins, Types, and Modes
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This paper was presented at the SM /ASM 2000 conference. It is offered here unedited, in its original format.
About the Author
Jon Huber has worked in the software industry for over a decade. After graduating from The University of Arizona, he went to work as a software engineer for IBM in Austin, Texas. After a few years, Jon took a software engineering job with Micron Semiconductor, Inc., in Boise, Idaho to move closer to family. At IBM and Micron, he worked primarily with object-oriented software systems.
Jon now works for Hewlett-Packard in the LaserJet Business
Products division in Boise, Idaho. For more than three years at HP, he led the LaserJet Common Software Metrics Initiative which provides measurement consulting and a metrics tool for over 34 past and current LaserJet products. Jon also champions defect and root cause analysis and has facilitated eight defect analysis projects for HP. While working at Hewlett-Packard, he has authored several
papers for Quality Week, Quality Week Europe, and Applications of Software Measurement/Managementconferences. Jon recently has been asked to help lead a task force to implement customer solution testing in the Hewlett-Packard LaserJet Test Lab. Outside of work, Jon enjoys family activities with his wife and four children, community service in a local youth organization, writing, jogging, and lifting weights.
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