A Comparison of IBM's and Hewlett Packard's Defect Classification

Jon Huber, Hewlett Packard

In this presentation, Jon Huber examines metrics obtained from categorizing the same set of defects using both IBM's Orthogonal Defect Classification and Hewlett Packard's Origins, Types, and Modes. Learn the pros and cons of each model, and how to apply the strengths from both models to create a method beneficial to software development and testing.

Upcoming Events

Apr 25
Jun 06
Oct 03
Nov 14