A Comparison of IBM's and Hewlett Packard's Defect Classification

[presentation]
by
Jon Huber, Hewlett Packard
Summary: 

In this presentation, Jon Huber examines metrics obtained from categorizing the same set of defects using both IBM's Orthogonal Defect Classification and Hewlett Packard's Origins, Types, and Modes. Learn the pros and cons of each model, and how to apply the strengths from both models to create a method beneficial to software development and testing.

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