A Comparison of IBM's and Hewlett Packard's Defect Classification
[presentation]
Summary:
In this presentation, Jon Huber examines metrics obtained from categorizing the same set of defects using both IBM's Orthogonal Defect Classification and Hewlett Packard's Origins, Types, and Modes. Learn the pros and cons of each model, and how to apply the strengths from both models to create a method beneficial to software development and testing.
Upcoming Events
Apr 25 |
STAREAST Software Testing Conference in Orlando |
Jun 06 |
Agile + DevOps West The Latest in Agile and DevOps |
Oct 03 |
STARWEST Software Testing Conference |
Nov 14 |
Agile + DevOps East The Latest in Agile and DevOps |