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Home > Detail: Statistical Process Control for Software Inspections


 | |  |  Statistical Process Control for Software Inspections
 By Don Porter

  
 Summary: This paper provides innovative guidelines for inspections SPC. The innovations include:
- Tracking fault density = faults/(amount inspected) rather than the number of faults. Since the number of faults follows a Poisson probability law, the fault density obeys a related exponential distribution.
-Tracking preparation and inspection efficiencies rather than rates. These are defined as (preparation time)/(amount inspected) and (inspection time)/(amount inspected). These variables fit gamma or lognormal distributions quite well. |  |  |

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View Content Detail: XDD2469filelistfilename1.PDF (595 Kb) This paper was presented at the SM/ASM 2001 Conference
About the Author Don Porter graduated from Northern Illinois University, where he received the Master of Arts Degree in Economics in 1978 and the Master of Science Degree in Statistics in 1980.
Don taught courses in Economics, Mathematics, and Statistics until 1985, when he entered the business world as a statistical consultant. He has worked for several Fortune 500 companies, including Continental Telephone, Ameritech, Abbott Labs, Amoco, and Motorola. His clients have also included several smaller companies in the Chicago area.
Don has experience in statistical modeling, experimental design, sampling design, statistical quality control and process improvement. He has developed and automated all major categories of control charts, including CUSUM and time series residuals charts.
Don is a member of the American Statistical Association and the American Society for Quality.
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