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Home > Detail: Efficiency and Effectiveness Measures To Help Guide the Business of Software Testing
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This paper was presented at the SM/ASM 1999 Conference
About the Author
Jon Huber has been a software quality engineer for Hewlett-Packard since 1996. His primary responsibilities include:
- The coordination and management of the LaserJet Common Metrics Initiative (a group that provides Metrics Consulting and an automated Metrics Tool for 32 current
and past Hewlett Packard LaserJet products)
- Boise site champion for Software Failure/Defect Analysis
- Have worked closely with Bob Grady, author of three books on Software Metrics and Process Improvement, to facilitate and analyze results from Software Failure Analysis workshops with seven
different Software Engineering Development teams
- Published “Developing Metrics for a Software Testing Organization." This paper was accepted and presented at the 11th International Software Quality Week in San Francisco, CA, May 1998
- Published “Software Defect Analysis: Real World Testing Implications & A Simple Model for Test Process Defect Analysis." This paper was accepted and presented at the 2nd International Software Quality Week Europe in Brussels, Belgium, November 1998.
- Previously, Mr. Huber was a software engineer at Micron Technology, Boise, Idaho and IBM, Austin, Texas. His responsibilities at Micron Technology included the development of an Object Oriented Semiconductor Manufacturing system. At IBM, he
was responsible for the development of an Object Oriented Supply Management Software system.
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