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Home > Detail: The Rapid Deployment of a Defect Analysis Program
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The Rapid Deployment of a Defect Analysis Program
By Steven H. Lett
  
Summary: This paper focuses on the defect analysis aspect of the process improvement task and describes how it was deployed quickly and economically.
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This paper was originally presented at Applications of Software Measurement (ASM) '99 — a conference produced by Software Quality Engineering. For more information on this conference, visit the current Applications of Software Measurement (ASM) Web site.
About the Author
Mr. Lett has 23 years of software engineering experience, as a software engineer and as a project manager, developing real-time Command and Control software applications,
primarily on the U.S. Navy’s P-3C Anti-Submarine Warfare program and the AEGIS guided missile cruiser and destroyer programs. He has extensive experience in leading process
improvement initiatives, especially in the areas of project management, software engineering processes, software metrics, training, group problem-solving, and employee
empowerment. He presented a paper, “An Earned Value Tracking System for Self-Directed Software Teams,” at the recent 1998 (U.S.) SEPG and European SEPG Conferences. Since early 1997 he has been a full-time member of the Lockheed Martin Government Electronic Systems (GES) Software Engineering Process Group (SEPG).
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